Features Max SM 1xN configuration is 1×64(Non-Splicing) Max MM 1xN configuration is 1×16(Non-Splicing) The Cylindrical package has direct analog voltage control of the MEMS mirror Proven MEMS durability and reliability Qualified to Telcordia GR-1073-CORE and RoHS Parameters Value...
Features Optical Cross—connector OXC Compact Form Factor Customizable Proven MEMS durability and reliability Qualified to Telcordia GR-1073-CORE and RoHS Parameters Value Unit Notes MxN 4×4/8×8/16×16 MxN ≤ 1024 Insertion Loss 4×4 ≤1.4 @S dB @CWL,23°C Without Connectors @S: 1310 or 1550 or 1625 8×8 ≤1.8 @S 16×16 ≤2.0 @S Switch Time...
Description Only by using an NTT-AT EUV half mirror, also known as a EUV multilayer beam splitter, can an interferometer for the extreme ultraviolet region be configured, operating in a similar way to those for the visible region...
Description NTT-AT has been supplying high-quality XUV, EUV, and X-ray mirrors for more than 20 years, it provides custom-designable multi-layer film mirrors adapted to meet individual customer requirements. Since the 1990s, NTT-AT has developed and sold extreme ultraviolet...
Description NTT-AT’s X-ray resolution evaluation charts are applied to several X-ray analysis situations which require ultra-high resolution, such as X-ray microscopes, X-ray micro-beam analysis, and X-ray imaging. This de facto standard X-ray chart is used in a very...
Description NTT-AT provides the SiC membrane-based Fresnel Zone Plate (FZP), which has an outstandingly high X-ray irradiation durability. NTT-AT’s FZP is constructed from dry etched Ta. It has a sharp absorber pattern and achieves a high S/N ratio...
Description NTT-AT’s extreme ultraviolet (XUV or EUV) filters realize high-transmittance, high-stability, and long-lifetime for various EUV experiments. This premium quality filters are pinholeless, without support mesh and support film, and having oxidation protective coatings. Premium free-standing EUV filters...