Description ETSC Sip-Chip/Bar automatic test system covers a variety of chips, including passive and active chips. The system uses required instruments to test chip performance indexes, such as IL, ER, RL FSR, Responsivity, etc. Vision algorithm can realize...
The system is designed for fast 100% wafer level testing to ensure known good chips for post fab wafer processing based capable of different levels of performance classifications. The system includes several functional blocks including defect detection, precision...
Description WI-6500 supports 25 wafer automatic-defect inspection systems. 25 6-inch wafers are carried into the system inspection wafer cassette by the shipping wafer cassette, the equipment closes the hatch. The vision system scans the number and position of...
LHX-302-COC Laser Reliability and aging test system The LHX-302 is an air-cooled, electrically heated, rack-mounted aging system that supports high-density, high-reliability laser for life testing, burn-in testing, and performance testing. Product Feature The LHX-302 laser reliability and aging...