Description WAT-226 High-power wafer testing system adopts a closed vacuum chamber, which gathers moving components, heating components, cooling components, wafer chucks, probe stations, probe arms and other components used for testing in the closed vacuum chamber. This safe...
Description WIT-220 Wafer optical-electrical probe station comprehensively considers the design requirements of stability, electrical noise processing and spatial layout. It adopts high-precision motion control system, high-performance vibration isolation system and combines self-developed image software algorithms to achieve small...
Description CA-1000 Silicon photonics chip auto-alignment system is consisted of sub-micron high-precision motion subsystems, high-performance vibration isolation system and multi-directional visual inspection system. The system adopts self-developed host computer software, integrates image recognition and artificial intelligence algorithms to...
Description WI-6500 Automatic wafer defect inspection system is consisted of machine vision inspection system, automatic loading and unloading system, automatic inspection system and control software. The system supports automatic defect inspection of 25 wafers (1 cassette). It can detect...