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Wafer/ Chip Packaging and Testing System
Reliability and Aging Testing System
Distributed Optical Fiber Sensing System
Optical Communication Diagnosis System
Photoelectric instrument
Lensed Fiber/ Fiber Array
SiC Epitaxy Wafer
WAT-226 High Power Wafer Test System
WIT-220 Wafer Optical-Electrical Characteristic Test System
CA-1000 Silicon Photonics Chip Auto-Alignment System
WI-6500 Automatic Wafer Defect Inspection System
Semiconductor laser diode aging and reliability testing system
OSI-S High-precision Distributed Optical Fiber Sensing Monitoring System
OCI-V Optical Vector Analysis System
OCI High-resolution Optical Link Diagnostic System
Swept Spectrum Analyzer (SSA)
OLI Low-Coherence Optical Link Diagnostic System
OSI-D Dynamic Distributed Optical Fiber Sensing Monitoring System
Long Working Distance Ball Lens
90° Bending Fiber Array
Tapered Lensed Fiber
Special Wedge Lensed Firber
Wedge Lensed Fiber
Angle Polished Fiber
High Speed and Low Noise Balance Photo Detector
LCM series Benchtop Laser Diode Controllers
High-precision Dark Current Measurement Module
SiC Epitaxy
High-power DFB Laser for SIPh Coupling
OSM-4200 Four-Channel Light Source
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