Semiconductor laser diode aging and reliability testing system

LHX-302-COC/COS Laser Reliability and aging test system

The LHX-302 is an air-cooled, electrically heated, rack-mounted aging system that supports high-density, high-reliability laser for life testing, burn-in testing, and performance testing.

Product Feature

The LHX-302 laser reliability and aging test system provides:

  • Can test up to 1280 lasers at the same time
  • Up to 2A laser drive current per channel
  • Flexible and reliable hot swapping operation, simple capacity expansion
  • Can replace aging drawers for aging lasers that are in different packages
  • APC, ACC and LIV test modes
  • Aging drawer supports measurement for external and/or internal photodiodes
  • Integrated Reliability Sys Control Software
  • Real-time monitoring channel status and test data
  • Can export saved test data
  • Intuitive graphical interface for checking system and test status
  • Can still process saved data during power outages and power cuts
  • The control measurement module automatically saves at least 5 hours of aging data (calculated in 5 minutes/time) in the accident of network failure
Aging power supply
Aging power supply
LIV test system
LIV test system
32-channel COC fixture
32-channel COC fixture
300μm pitch probe repeatability test
300μm pitch probe repeatability test
System
System capacity up to 1280
Package Type TO-Can, Butterfly, COC, COS, Custom
Per fixture station up to 32
Temperature control
Temperature range +40 – +120 ℃
Temperature control unit single drawer
Temperature control accuracy ± 1.0℃
Temperature Control Stability ± 1.0℃
Laser control
Output polarity Independently parallel output, common cathode, customized drive current
Output Range 200mA (Typical), Customizable to 2000mA
Setting accuracy ± 1% of FS
Output Stability ± 1% of FS
Compliant voltage 3.3V (typical); customizable high voltage
Control Mode Constant Current, Constant Power (Custom), LIV Test
Measurement function
Laser voltage
Range +3.3V (typical)
Accuracy ± 0.1V
Built-in PD deflection voltage (custom) 0 – 8V
Measuring range (custom) 20 – 5000 µA
Stability (custom) ± 5 µA
Front face PD (LIV function)
Wavelength range 400 – 1600nm
Measurement Mode Relative Change Value
Ith calculation repeat accuracy ≤ 3%
General features
Dimension (HxWxD) cm 200 x 130 x 84
Power Requirements 350-420 VAC, 50/60 Hz, 50A,Three Phase
System control computer and monitoring software
Computer Pentium 4 core processor, 4G RAM, 10G free disk space
Display 14 inches (resolution: 1024*768)
UPS backup power > 1h
Operating System Microsoft Windows®
System Control Software Reliability Sys
Program code executable program

Explanation

The stability measurement time is 48 hours.

Download

LHX-302-COC/COS Datasheet

All Information given here is reliable to our best knowledge. No responsibility is assumed for possible inaccuracies or omissions. Specifications and external appearances are subject to change without notice.